ELINT Analysis and Interception

This is a combined version of the two popular ELINT Analysis and ELINT Interception seminars, recognized all over the world as the "bible" of ELINT. You will learn analysis techniques and limitations of ELINT in inferring radar performance as well as intercept receiver strengths and weaknesses. You will also learn about direction finding and the problem of locating emitters.

Seminar Outline

Day 1

Character and uses of ELINT
Radar fundamentals
RF generation and propagation
Noise figure and bandwidth
Sensitivity and dynamic range
Pulse density vs altitude
ELINT range advantage

Day 2

Crystal video receivers
Noise limited vs gain limited
Superhet receivers
Analog/digital IFM receivers
Channelized and Bragg Cell receivers
Microscan and other receivers
Modern phase processing receivers
Direction finding techniques

Day 3

Emitter location via triangulation
Time difference of arrival (TDOA)
Probability of Interception
ERP analysis
Polarization analysis
Beam shape analysis
Antenna scan analysis
Pulse shape analysis

Day 4

Intrapulse modulation
Wideband signals
PRI Types
MTI and pulse Doppler analysis
PRI measurement problems
Deinterleaving
Delta-T and other histograms
RF analysis and coherence Measures
ELINT parameter limits
LPI Radar and the future of ELINT

Seminar Materials:

Electronic Intelligence: The Analysis of Radar Signals (2nd Ed) by R.G. Wiley. Seminar notes and a Certificate.

Who Should Attend

Anyone who is interested in ELINT information and must be aware of its capabilities and limitations. The material describes how to intercept and analyze modern radar signals using various receiving techniques and intercept strategies and how ELINT techniques have evolved in response to more modern radars.

Instructor(s)

Richard G. Wiley, Ph.D., Vice President and Chief Scientist of RAS, Inc., has over 30 years of experience in ELINT/EW, specializing in signal analysis and receivers. He has a BS/MSEE degree from Carnegie-Mellon University and a Ph.D. from Syracuse University. He is a Fellow of the IEEE and has authored three books and twenty technical papers.